Journal of Conservative Dentistry
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ORIGINAL ARTICLE
Year : 2012  |  Volume : 15  |  Issue : 2  |  Page : 151-155

Morphological evaluation of new total etching and self etching adhesive system interfaces with dentin


Department of Conservative Dentistry and Endodontics, A.B. Shetty Memorial Institute of Dental Sciences, Deralakatte, Mangalore, Karnataka, India

Correspondence Address:
Mithra N Hegde
Department of Conservative Dentistry and Endodontics, A.B. Shetty Memorial Institute of Dental Sciences, Deralakatte, Mangalore - 575 018, Karnataka
India
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Source of Support: None, Conflict of Interest: None


DOI: 10.4103/0972-0707.94589

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Aim: The purpose of this study is to evaluate the resin-dentin interface, quality of the hybrid layer of total-etching and self-etching adhesive systems under scanning electron microscopy (SEM). Materials and Methods: Class V cavities were prepared in 40 extracted human molars. In Group I XP bond (Dentsply), in Group II Adper Single Bond II (3M ESPE), in Group III Adper Easy One (3M ESPE), and in Group IV Xeno V (Dentsply) were applied. Teeth were restored with resin composite, subjected to thermocycling, and sectioned in Buccolingual plane. The samples were demineralized using 6N HCl, for 30 sec, and deproteinized with 2.5% NaOCl for 10 min, gold sputtered, and viewed using a scanning electron microscope. Results: Among the total-etch systems used, the XP Bond showed a clear, thick hybrid layer, with long resin tags and few voids. Among the self-etch adhesive systems, the Xeno V did not show a clearly recognizable hybrid layer, but there were no voids and continuous adaptation was seen with the dentin. Conclusion: The adaptation of self-etch adhesives to the resin-dentin interface was good without voids or separation of phases; showing a thin, continuous hybrid layer.


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